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翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク Hot-point probe ： ウィキペディア英語版 Hot-point probe A hot point probe is a method of determining quickly whether a semiconductor sample is n (negative) type or p (positive) type. A voltmeter or ammeter is attached to the sample, and a heat source, such as a soldering iron, is placed on one of the leads. The heat source will cause charge carriers (electrons in an n-type, electron holes in a p-type) to move away from the lead. The heat from the probe creates an increased number of higher energy carriers which then diffuse away from the contact point. This will cause a current/voltage difference. For example, if the heat source is placed on the positive lead of a voltmeter attached to an n-type semiconductor, a positive voltage reading will result as the area around the heat source/positive lead becomes positively charged.〔http://fabweb.ece.uiuc.edu:1999/Equipment/HotPointProbes/Instructions.html〕 ==References== 〔 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Hot-point probe」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.